Symposia

Characterization and Modeling (CAM)

After the successful symposium on ‘Characterization and Modeling’ in Lisbon in ISNNM 2018, we decided to continue this attractive event in ISNNM 2020 in Wien. This symposium to be chaired by Prof. Hyoung Seop Kim and Prof. Jae Bok Seol (POSTECH) will address the characterization and modeling of Novel and Nano Materials. Various advanced-characterizations leading to state-of-the-art novel and nanomaterials, such as 2D/3D optical, scanning electron, transmission electron microscopes, 3D atom probe tomography, nanoindentation, in situ methods and other several characterization techniques, are well within the scope of the symposium. New processes involving compaction of nanopowders or nanostructuring of the near-surface regions of a structural member are also considered as relevant to its theme. All levels of modeling and computer simulations, e.g., first principle, molecular statics/dynamics, Monte Carlo method, dislocation dynamics, phase field method, finite element method, and their coupled techniques can be covered in this symposium.

Topics of interest include (but are not limited to)
  • Advanced characterization of novel and nanomaterials, such as
  • 2D/3D optical, scanning electron, transmission electron microscopes
  • 3D atom probe tomography
  • Nanoindentation
  • in situ methods and other several characterization techniques
  • All levels of modeling and computer simulations, such as
  • first principle, molecular statics/dynamics, Monte Carlo method, dislocation dynamics, phase field method, finite element method, and their coupled techniques
Symposium Organizers

Prof. Hyoung Seop Kim
POSTECH, Department of Materials Science and Engineering, Pohang, Republic of Korea
Tel +82-54-270-2150, Fax+ 82-54-279-2399
hskim@postech.ac.kr

Prof. Jae Bok Seol
Gyeongsang National University, Republic of Korea
jb.seol@gnu.ac.kr

Prof. Hyunjoo Choi
Kookmin University, Republic of Korea
hyunjoo@kookmin.ac.kr

Prof. Zoltan Gacsi
University of Miskolc, Hungary

Related journals
Archives of Metallurgy
and Materials
ISSN:1733-3490
eISSN:2300-1909
SCIE (I. F. 0.586)