Characterization and Modeling (CAM)
* Session Organizers

  Prof. Hyoung Seop KIM (Pohang University of Science and Technology, Republic of Korea)
  Prof. Seong Jin PARK (Pohang University of Science and Technology, Republic of Korea)

This session will address the characterization and modeling of Novel and Nano Materials. Various advanced characterizations leading to state-of-the-art novel and nanomaterials, such as 2D/3D optical, scanning electron, transmission electron microscopes, 3D atom probe tomography, nanoindentation, in situ methods and other several characterization techniques, are well within the scope of the symposium. New processes involving compaction of nanopowders or nanostructuring of the near surface regions of a structural member are also considered as relevant to its theme. All levels of modeling and computer simulations, e.g., first principle, molecular statics/dynamics, Monte Carlo method, dislocation dynamics, phase field method, finite element method, and their coupled techniques can be covered in this symposium.

Topics of interest include
  • Advanced characterization of novel and nanomaterials, such as 2D/3D optical, scanning electron, transmission electron microscopes, 3D atom probe tomography and Nanoindentation
  • In situ methods and other several characterization techniques
  • All levels of modeling and computer simulations, such as first principle, molecular statics/dynamics, Monte Carlo method, dislocation dynamics, phase field method, finite element method, and their coupled techniques